On-line Measurement of Yarn Faults through Interfacing with Computer

摘要

Yam is passed through the desired slot of the capacitance probe/sensor. The variation in mass is converted to analogue signal and displayed in the meter of the machine. The output signal (mv dc) is fed to an instrumentation amplifier, which amplifies the input signal to the desired level as required by the AD conversion card. This is achieved by varying the sensitivity and span control of the amplifier unit. The amplified output is measured with multimeter and adjusted according to the requirement. This signal is fed to the computer in 'on-line manner' through the AD card and on-line mass and diameter variation are represented through graph. The variation in the mass and diameter values is also stored and can be displayed on the monitor of the computer. Thus, the imperfections present in a yam can be calculated and are displayed on the monitor of the computer.