Non-destructive investigation of composition, chemical properties and structure of materials by synchrotron radiation

摘要

The use of synchrotron radiation at BAM for various types of analysis of solid samples could be demonstrated successfully. Main results are the implementation of reflectometry on thin surface layers and the qualification of energy dispersive X-ray fluorescence for certification and its use for highly specialised analyses, first examples of X-ray absorption spectrometry for speciation analysis of chromium and gold in glass. Analysis of unique objects of art was introduced as a by-product being of broad interest to the public. In future, the certification of trace elements has to be complemented by that of minor and major components through introduction of synchrotron radiation-based wavelength-dispersive X-ray fluorescence (SyWDXRF) and more sophisticated evaluation schemes including general Monte Carlo codes and improved fundamental parameters. Moreover, X-ray absorption spectrometry has to be combined with other methods of structural analysis in order to strengthen the reliability of statements deductions and to open new ways for solving problems. Finally, the experimental environment has to be completed primarily by versatile in situ capabilities.