Optical metrology

摘要

Using its expertise within the field of metrology, Olympus is deeply involved in the development of systems to provide surface topography data of the highest quality and consistency. Enabling pioneering research and routine inspection in material science, Olympus offers an extensive range of microscopes and accessories for observing surfaces and analysing new materials and nanoparticles. The LEXT OLS4000 confocal laser microscope combines high resolution (down to 120 nm) with outstanding slope detection capabilities of up to 85°. With fast and easy operation, and advanced dual pinhole technology, users are provided with the highest possible resolution and clarity.