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Accuracy And Efficiency Comparisons Of Single- And Multi-cycled Software Classification Models

机译:单周期和多周期软件分类模型的准确性和效率比较

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Software classification models have been regarded as an essential support tool in performing measurement and analysis processes. Most of the established models are single-cycled in the model usage stage, and thus require the measurement data of all the model's variables to be simultaneously collected and utilized for classifying an unseen case within only a single decision cycle. Conversely, the multi-cycled model allows the measurement data of all the model's variables to be gradually collected and utilized for such a classification within more than one decision cycle, and thus intuitively seems to have better classification efficiency but poorer classification accuracy. Software project managers often have difficulties in choosing an appropriate classification model that is better suited to their specific environments and needs. However, this important topic is not adequately explored in software measurement and analysis literature. By using an industrial software measurement dataset of NASA KC2, this paper explores the quantitative performance comparisons of the classification accuracy and efficiency of the discriminant analysis (DA)- and logistic regression (LR)-based single-cycled models and the decision tree (DT)-based (C4.5 and ECHAID algorithms) multi-cycled models. The experimental results suggest that the re-appraisal cost of the Type Ⅰ MR, the software failure cost of Type Ⅱ MR and the data collection cost of software measurements should be considered simultaneously when choosing an appropriate classification model.
机译:软件分类模型已被视为执行测量和分析过程中必不可少的支持工具。大多数已建立的模型在模型使用阶段都是单周期的,因此需要同时收集所有模型变量的测量数据,并将其用于仅在单个决策周期内对未发现的案例进行分类。相反,多周期模型允许在一个以上的决策周期内逐步收集并使用所有模型变量的测量数据进行分类,因此直观上似乎具有更好的分类效率,但分类精度较差。软件项目经理通常在选择更适合其特定环境和需求的适当分类模型时遇到困难。但是,在软件测量和分析文献中并未充分探讨这个重要主题。通过使用NASA KC2的工业软件测量数据集,本文探索了基于判别分析(DA)和逻辑回归(LR)的单周期模型和决策树(DT)的分类准确性和效率的定量性能比较。 (基于C4.5和ECHAID算法)的多周期模型。实验结果表明,在选择合适的分类模型时,应同时考虑Ⅰ型MR的重新评估成本,Ⅱ型MR的软件故障成本和软件测量的数据收集成本。

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