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Hierarchical Monitoring and Root-Cause Diagnosis Framework for Key Performance Indicator-Related Multiple Faults in Process Industries

机译:分层监测和根本原因诊断框架,用于关键性能指标相关的流行行业中的多个故障

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摘要

In actual production processes, the occurrence probability of multiple faults is much higher than that of a single fault, which will affect the process industry operating performance and final products quality. This paper is concerned with industrial practices and theoretical approaches for detection and location of key performance indicator (KPI) related multiple faults in process industries. First, a new KPI-related multiple fault monitoring scheme is addressed from the subprocess level based on the developed correlation-based canonical variable analysis model. Then, Bayesian fusion is implemented to form the final monitoring decisions from the plantwide level. After that, a tensor subspace analysis-based discriminant analysis method is proposed for locating the root causes, which will help field engineers to take correction actions and recover the process operations. Finally, the application to a typical industry process, i.e., hot strip mill process, is given to demonstrate the performance and effectiveness of the proposed methods with real industrial data.
机译:在实际生产过程中,多个断层的发生概率远高于单个故障,这将影响过程行业运营性能和最终产品质量。本文涉及工业措施和关键绩效指标(KPI)相关多重故障的检测和理论方法。首先,基于基于开发的基于相关的CONONICAL可变分析模型,从子过程级别寻址了新的KPI相关的多个故障监测方案。然后,实施贝叶斯融合以形成植物水平的最终监测决策。之后,提出了一种基于张力子空间分析的判别分析方法,用于定位根本原因,这将有助于现场工程师采取校正动作并恢复过程操作。最后,给出了典型行业过程,即热带轧机过程的应用,以证明所提出的方法具有实际工业数据的性能和有效性。

著录项

  • 来源
    《IEEE transactions on industrial informatics》 |2019年第4期|2091-2100|共10页
  • 作者单位

    Univ Sci & Technol Beijing Sch Automat & Elect Engn Minist Educ Key Lab Knowledge Automat Ind Proc Beijing 100083 Peoples R China;

    Univ Sci & Technol Beijing Sch Automat & Elect Engn Minist Educ Key Lab Knowledge Automat Ind Proc Beijing 100083 Peoples R China;

    Univ Sci & Technol Beijing Sch Automat & Elect Engn Minist Educ Key Lab Knowledge Automat Ind Proc Beijing 100083 Peoples R China;

    Univ Sci & Technol Beijing Sch Automat & Elect Engn Minist Educ Key Lab Knowledge Automat Ind Proc Beijing 100083 Peoples R China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Hierarchical monitoring; KPI; multiple faults; process industries; root cause diagnosis;

    机译:分层监测;KPI;多个故障;过程行业;根本原因诊断;

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