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首页> 外文期刊>IEEE transactions on industrial informatics >Hierarchical Monitoring and Root-Cause Diagnosis Framework for Key Performance Indicator-Related Multiple Faults in Process Industries
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Hierarchical Monitoring and Root-Cause Diagnosis Framework for Key Performance Indicator-Related Multiple Faults in Process Industries

机译:流程行业中与关键绩效指标相关的多个故障的分层监视和根本原因诊断框架

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摘要

In actual production processes, the occurrence probability of multiple faults is much higher than that of a single fault, which will affect the process industry operating performance and final products quality. This paper is concerned with industrial practices and theoretical approaches for detection and location of key performance indicator (KPI) related multiple faults in process industries. First, a new KPI-related multiple fault monitoring scheme is addressed from the subprocess level based on the developed correlation-based canonical variable analysis model. Then, Bayesian fusion is implemented to form the final monitoring decisions from the plantwide level. After that, a tensor subspace analysis-based discriminant analysis method is proposed for locating the root causes, which will help field engineers to take correction actions and recover the process operations. Finally, the application to a typical industry process, i.e., hot strip mill process, is given to demonstrate the performance and effectiveness of the proposed methods with real industrial data.
机译:在实际生产过程中,多个故障的发生概率要比单个故障的发生概率高得多,这将影响加工行业的运行性能和最终产品的质量。本文涉及与过程工业中关键绩效指标(KPI)相关的多个故障的检测和定位的工业实践和理论方法。首先,基于已开发的基于相关性的规范变量分析模型,从子过程级别解决了一种新的KPI相关的多故障监视方案。然后,实施贝叶斯融合以形成全厂范围的最终监控决策。此后,提出了一种基于张量子空间分析的判别分析方法来定位根本原因,这将有助于现场工程师采取纠正措施并恢复过程操作。最后,将其应用于典型的工业过程,即热轧机过程,以利用真实的工业数据证明所提出的方法的性能和有效性。

著录项

  • 来源
    《IEEE transactions on industrial informatics》 |2019年第4期|2091-2100|共10页
  • 作者单位

    Univ Sci & Technol Beijing, Sch Automat & Elect Engn, Minist Educ, Key Lab Knowledge Automat Ind Proc, Beijing 100083, Peoples R China;

    Univ Sci & Technol Beijing, Sch Automat & Elect Engn, Minist Educ, Key Lab Knowledge Automat Ind Proc, Beijing 100083, Peoples R China;

    Univ Sci & Technol Beijing, Sch Automat & Elect Engn, Minist Educ, Key Lab Knowledge Automat Ind Proc, Beijing 100083, Peoples R China;

    Univ Sci & Technol Beijing, Sch Automat & Elect Engn, Minist Educ, Key Lab Knowledge Automat Ind Proc, Beijing 100083, Peoples R China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Hierarchical monitoring; KPI; multiple faults; process industries; root cause diagnosis;

    机译:分层监测;KPI;多个故障;过程行业;根本原因诊断;

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