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Implementation Aspects of Logic Functions using Single Electron Threshold Logic Gates and Hybrid SET-MOS Circuits

机译:使用单电子阈值逻辑门和混合SET-MOS电路的逻辑功能的实现方面

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摘要

Single electron technology is an attractive technology for future low-power VLSI/ULSI systems. Single electronics implies the possibility to control the movement and position of a single electron or a small amount of electrons. In this work, design, implementation, and analysis of logic functions are presented using single electron threshold logic gate (TLG) and hybrid SET-MOS circuits. The logic operation of the designed circuit is tested using Monte Carlo-based simulation tool SIMON for the single electron threshold logic circuit. For the hybrid SET-MOS-based implementation, the logic operation of the circuit is verified in Tanner environment. A compact analytical model with 11 island states for SET devices and BSIM4.6.1 model for MOS is used. The influence of thermal fluctuation on the stability of the threshold logic-based circuit, caused by increase in system temperature, has been thoroughly investigated. The effect of island states on the performance of the hybrid SET-MOS circuit is analysed. Finally, the performances of both the design approaches have been analysed and compared in terms of circuit elements, voltage levels, power consumption, and delay.
机译:对于未来的低功耗VLSI / ULSI系统,单电子技术是一种有吸引力的技术。单个电子器件意味着可以控制单个电子或少量电子的运动和位置。在这项工作中,使用单电子阈值逻辑门(TLG)和混合SET-MOS电路介绍了逻辑功能的设计,实现和分析。使用基于蒙特卡洛的仿真工具SIMON对单电子阈值逻辑电路进行测试,以测试设计电路的逻辑操作。对于基于SET-MOS的混合实现,在Tanner环境中验证了电路的逻辑操作。使用用于SET器件的具有11个岛状态的紧凑分析模型和用于MOS的BSIM4.6.1模型。已经详细研究了由系统温度升高引起的热波动对基于阈值逻辑的电路的稳定性的影响。分析了孤岛状态对混合SET-MOS电路性能的影响。最后,对两种设计方法的性能进行了分析和比较,包括电路元件,电压电平,功耗和延迟。

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