Analysis and Testing of Bridging Faults in CMOS Synchronous Sequential Circuits

摘要

In this paper, we analyze behaviors of bridging faults in CMOS synchronous sequential circuits based on transient analysis. From analysis results, we expose dynamic and analog behaviors of the circuit caused by the bridging faults, which are oscillation, asynchronous sequential behavior, IDDT failure and IDDQ failure as well as logic error. In order to detect this kind of fault, we show that not only IDDQ testing but also IDDT testing and logic testing which guarantees correct state transitions are required.