机译:单事件翻转容错RS触发器与小面积
Graduate School of Advanced Integration Science, Chiba University, Chiba-shi, 263-8522 Japan;
Graduate School of Advanced Integration Science, Chiba University, Chiba-shi, 263-8522 Japan;
Graduate School of Advanced Integration Science, Chiba University, Chiba-shi, 263-8522 Japan;
soft error; single-event-upset (SEU) tolerance; reset-set flip- flop (RS-FF); interlocking feedback loop;
机译:单事件翻转容错RS触发器与小面积
机译:工艺变化和电荷共享对触发器单事件翻转响应的影响
机译:采用65 nm批量技术的Alpha-Particle,碳离子和质子诱导的触发器单事件翻转
机译:具有容忍对组合电路的软错误和瞬态的触发器的强大架构
机译:容错触发器设计用于超低功耗亚阈值逻辑。
机译:低摆幅驱动器的单事件翻转灵敏度分析
机译:单事件翻转容错RS触发器与小面积