A DFT Controller for Instruction-Based Functional Test

摘要

This paper presents a DFT controller called as a TCU (test Control Unit), which considerably improves the efficiency of the instruction-based functional test. Internal pro- gram/data buses are completely controllable and observable by the TCU during the test cycle. Diverse test modes of the TCU can increase the test efficiency and also provide complete access to program/data memories for functional test.