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Improvement Of Measurement Method For Luminance Distribution Of Electron Beam Spot In Color Display Tubes

机译:彩色显像管中电子束斑点亮度分布测量方法的改进

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摘要

A method for measuring the luminance distribution of an electron beam spot was described, which is fundamental to evaluate the resolution of a color display tube. First, to achieve high sensitivity and wide dynamic range identical to those of visual inspection, we proposed the use of an ICCD camera for imaging and two levels of sensitivity. With that method, we were able to measure the luminance distribution of an electron beam spot over a range of currents that extends from the extremely weak cathode current region to large current that correspond to the peak luminance. Specifically, we were able to measure the entire distribution shape from the base to the peak for beam spots in the cathode current range from 20 μA to 300 μA, while compensating the absolute luminance level. Second, a reconstruction algorithm of entire beam distribution from the shape of the masked part of the beam was also proposed, in which shift error is compensated to reduce the variance in measurement results caused by jitter noise in the conventional image processing method. That algorithm improves the reproducibility of repeated measurements. Specifically, a function for estimating the actual shift from the first-order moment of the image was incorporated into the spot shape reconstruction algorithm, resulting in a reduction of the standard deviation for repeated measurements of the horizontal beam spot diameter at 5% intensity from 0.02 mm to 0.005 mm
机译:描述了一种用于测量电子束点的亮度分布的方法,这是评估彩色显像管的分辨率的基础。首先,为了实现与视觉检查相同的高灵敏度和宽动态范围,我们建议使用ICCD相机进行成像和两个级别的灵敏度。使用该方法,我们能够测量从极弱的阴极电流区域到对应于峰值亮度的大电流范围内的电流范围内电子束点的亮度分布。具体而言,我们能够测量阴极电流范围从20μA到300μA的束斑从底部到峰值的整个分布形状,同时补偿了绝对亮度。其次,还提出了一种从光束的被遮盖部分的形状重建整个光束分布的算法,该算法对位移误差进行补偿,以减少传统图像处理方法中由抖动噪声引起的测量结果的差异。该算法提高了重复测量的可重复性。具体而言,将用于估计与图像一阶矩的实际偏移的函数合并到光斑形状重建算法中,从而将以5%强度重复测量水平光束光斑直径的标准偏差从0.02降低到了0.02。毫米至0.005毫米

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