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Analysis and Design of Sub-Threshold R-MOSFET Tunable Resistor

机译:亚阈值R-MOSFET可调电阻的分析与设计

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摘要

The sub-threshold R-MOSFET resistor structure which enables tuning range extension below the threshold voltage in the MOS-FET with moderate to weak inversion operation is analyzed in detail. The principal operation of the sub-threshold resistor is briefly described. The analysis of its characteristic based on approximations of a general MOS equation valid for all regions is given along with discussion on design implication and consideration. Experiments and simulations are provided to validate the theoretical analysis and design, and to verify the feasibility at a supply voltage as low as 0.5 V using a low-threshold devices in a 1.8-V 0.18 μm CMOS process.
机译:详细分析了亚阈值R-MOSFET电阻器结构,该结构可在MOS-FET中以中等至弱的反向操作使调谐范围扩展到阈值电压以下。简要描述了亚阈值电阻器的主要操作。基于对所有区域均有效的通用MOS方程的近似值,对其特性进行了分析,并讨论了设计意义和考虑因素。提供了实验和仿真,以验证理论分析和设计,并在1.8V 0.18μmCMOS工艺中使用低阈值器件验证在低至0.5 V的电源电压下的可行性。

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