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Multilevel dual-channel NAND flash memories with high read and program verifying speeds utilizing asymmetrically-doped channel regions

机译:利用非对称掺杂的通道区域,具有高读取和编程验证速度的多级双通道NAND闪存

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摘要

The multilevel dual-channel (MLDC) not-AND (NAND) flash memories cell structures with asymmetrically-doped channel regions between the source and the drain were proposed to enhance read and program verifying speeds. The channel structure of the MLDC flash memories consisted of two different doping channel regions. The technical computer aided design simulation results showed that the designed MLDC NAND flash cell with asymmetrically-doped channel regions provided the high-speed multilevel reading with a wider current sensing margin and the high-speed program verifying due to the sensing of the discrete current levels. The proposed unique MLDC NAND flash memory device can be used to increase read and program verifying speed.
机译:提出了在源极和漏极之间具有非对称掺杂沟道区的多级双通道(MLDC)非与(NAND)闪存单元结构,以提高读取和编程验证的速度。 MLDC闪存的通道结构由两个不同的掺杂通道区域组成。技术计算机辅助设计仿真结果表明,所设计的具有非对称掺杂沟道区的MLDC NAND闪存单元提供了具有更宽电流感测裕度的高速多电平读取,并且由于感测了离散电流电平而提供了高速程序验证。所提出的独特的MLDC NAND闪存器件可用于提高读取和编程验证速度。

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  • 来源
    《電子情報通信学会技術研究報告》 |2009年第98期|p.213-217|共5页
  • 作者单位

    Division of Electronics and Computer Engineering, Hanyang University, 17 Haengdang-dong, Seoungdong-gu, Seoul 133-791, Korea;

    Division of Electronics and Computer Engineering, Hanyang University, 17 Haengdang-dong, Seoungdong-gu, Seoul 133-791, Korea;

    Department of Nanoscale Semiconductor Engineering, Hanyang University, 17 Haengdang-dong, Seoungdong-gu, Seoul 133-791, Korea;

    Division of Electronics and Computer Engineering, Hanyang University, 17 Haengdang-dong, Seoungdong-gu, Seoul 133-791, Korea;

    Division of Electronics and Computer Engineering, Hanyang University, 17 Haengdang-dong, Seoungdong-gu, Seoul 133-791, Korea,Division of Electronics and Computer Engineering, Hanyang University, 17 Haengdang-dong, Seoungdong-gu, Seoul 133-791, Korea;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    NAND flash memory; multilevel dual-channel; high-speed multilevel reading; current sensing; and high-speed program verifying;

    机译:NAND闪存;多级双通道;高速多层阅读;电流感应和高速程序验证;
  • 入库时间 2022-08-18 00:35:41

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