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Effects of Ultraviolet Photon Irradiation on the Dielectric Properties of Polyimide

机译:紫外线光子辐照对聚酰亚胺介电性能的影响

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摘要

Ultraviolet photons were irradiated to the surface of all-aromatic polyimide films using a KrF excimer laser or a KrCl excimer lamp, and electrical properties such as permittivity, dielectric loss factor, conductivity, and space charge distribution were measured. In the case of the intense laser irradiation, the photo-induced change is drastic. The irradiated side of the sample is carbonized and becomes conductive. The apparent thickness of the remaining insulating region estimated by the space charge distribution measurements agrees with that observed by an optical microscope. The permittivity of the remaining apparently insulating region decreases as the irradiation proceeds, which is due to a decrease in the number of carbonyl groups. The dielectric loss factor and conductivity in this region increase since the leakage current increases even in this apparently insulating region. The activation energy of conduction also increases. In the case of the weak lamp irradiation, the permittivity decreases and the conductivity increases, although clear surface change is hardly observable. It is indicated from space charge distribution measurements that carrier traps are formed by the irradiation.
机译:使用KrF准分子激光或KrCl准分子灯将紫外线光子照射到全芳香族聚酰亚胺薄膜的表面,并测量介电常数,介电损耗因子,电导率和空间电荷分布等电性能。在强激光照射的情况下,光致变化是剧烈的。样品的照射面被碳化并变成导电的。通过空间电荷分布测量估计的剩余绝缘区域的表观厚度与通过光学显微镜观察到的厚度一致。随着照射的进行,剩余的表观绝缘区域的介电常数降低,这是由于羰基数量的减少。该区域的介电损耗因数和电导率增加,因为即使在该表观绝缘区域中,泄漏电流也会增加。传导的活化能也增加。在弱灯照射的情况下,尽管几乎观察不到清晰的表面变化,但介电常数降低并且电导率增加。从空间电荷分布测量结果表明,通过辐射形成了载流子陷阱。

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