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首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >Full-circular surface acoustic wave excitation for high resolution acoustic microscopy using spherical lens and time gate technology
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Full-circular surface acoustic wave excitation for high resolution acoustic microscopy using spherical lens and time gate technology

机译:全球形表面声波激发,用于使用球面透镜和时间门技术的高分辨率声学显微镜

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摘要

With a fixed gate width under the condition where the focus of an acoustic lens was set inside the sample, we varied signal taking-in time. Discrimination was made between differences in time required for an ultrasonic signal reflected from the sample to reach the acoustic lens. This process also enabled three types of images to be obtained separately: the surface reflection wave image, a combination of images based on the interference of the surface reflection wave with surface acoustic waves, and the surface acoustic wave image. Thus it was presumed that this process also would reveal the causes of image contrast and allow an easy interpretation of images. Furthermore, the image resolution was improved, because the surface acoustic wave image was drawn by an ultrasonic beam produced by full-circular surface acoustic wave excitation propagating toward the center converging concentrically; the theoretical resolution was 0.4 times the value of the surface acoustic wave wavelength /spl lambda//sub R/ and independent of the defocus value of the acoustic lens. Several kinds of samples were observed with this method. The results showed that the new method permitted observation of the internal structures of samples while offering new knowledge through the data reflecting the ultrasonic wave damping and scatter drawn on the display.
机译:在将声透镜的焦点设置在样品内部的条件下,使用固定的门宽,我们可以改变信号的吸收时间。区分了从样品反射的超声波信号到达声透镜所需的时间差。该处理还使得能够分别获得三种类型的图像:表面反射波图像,基于表面反射波与表面声波的干涉的图像的组合,以及表面声波图像。因此推测该过程也将揭示图像对比度的原因并允许图像的容易解释。另外,由于表面声波图像是由全圆形的表面声波激发向中心传播并同心会聚而产生的超声波束绘制的,因此提高了图像分辨率。理论分辨率是表面声波波长/splλ// sub R /的值的0.4倍,并且与声透镜的散焦值无关。用这种方法观察到几种样品。结果表明,该新方法可以观察样品的内部结构,同时通过反映显示在显示器上的超声波衰减和散射的数据提供新知识。

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