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首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >Quantitative flaw reconstruction from ultrasonic surface wavefieldsmeasured by electronic speckle pattern interferometry
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Quantitative flaw reconstruction from ultrasonic surface wavefieldsmeasured by electronic speckle pattern interferometry

机译:电子散斑干涉法从超声表面波场定量探伤

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A new method for imaging flaws in plate and shell structures isnpresented. The method employs two-dimensional ultrasonic surface wavendata obtained by optical electronic speckle pattern interferometryn(ESPI) techniques. In the imaging method, the measured out-of-planendisplacement field associated with an externally excited ultrasonic Lambnwave is processed to obtain the spatial frequency domain spectrum of thenwavefield. A free space Green's function is then deconvolved from thenwavefield to obtain quantitative images of effective scattering sources.nBecause the strength of these effective sources is directly dependent onnlocal variations in sample thickness and material properties, thesenimages provide a direct map of internal inhomogeneities. Simulationnresults show that the method accurately images flaws for a wide range ofnsizes and material contrast ratios. These results also demonstrate thatnflaw features much smaller than an acoustic wavelength can be imaged,nconsistent with the theoretical capability of the imaging method tonemploy scattered evanescent waves. Reconstructions are also obtainednfrom ultrasonic Lamb wave displacement fields recorded by ESPI in anflawed aluminum plate. These reconstructions indicate that the presentnmethod has potential for imaging flaws in complex structures for whichnESPI wavefield measurements cannot be straightforwardlyninterpreted
机译:提出了一种成像板壳结构缺陷的新方法。该方法利用通过光学电子散斑图案干涉法(ESPI)技术获得的二维超声表面波数据。在成像方法中,处理与外部激发的超声波兰姆波相关的测得的平面外位移场,以获得当时波场的空间频域频谱。然后从波场中对自由空间格林函数进行反卷积,以获得有效散射源的定量图像。n由于这些有效源的强度直接取决于样本厚度和材料特性的局部变化,因此,这些图像可以直接显示内部不均匀性。仿真结果表明,该方法可以在各种尺寸和材料对比度的情况下准确地成像缺陷。这些结果还表明,可以成像比声波波长小得多的n缺陷特征,这与成像方法音色散散逝波的理论能力不一致。还可以通过ESPI在有缺陷的铝板中记录的超声波兰姆波位移场进行重建。这些重建表明,本方法具有成像复杂结构中缺陷的潜力,而对于这些结构,nESPI波场测量无法直接解释。

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