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Characterization of piezocrystals for practical configurations with temperature- and pressure-dependent electrical impedance spectroscopy

机译:实用配置中依赖于温度和压力的电阻抗光谱法对压电晶体的表征

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摘要

Piezoelectric single crystal materials such as (x)Pb(Mg1/3Nb2/3)O3-(1-x)PbTiO3 (PMN-PT) have, by some measures, significantly better performance than established piezoelectric ceramics for ultrasound applications. However, they are also subject to phase transitions affecting their behavior at temperatures and pressures encountered in underwater sonar and actuator applications and in non-destructive testing at elevated temperatures. Materials with modified compositions to reduce these problems are now under development, but application-oriented characterization techniques need further attention. Characterization with temperature variation has been reported extensively, but the range of parameters measured is often limited and the effects of pressure variation have received almost no attention. Furthermore, variation in properties between samples is now rarely reported. The focus of this paper is an experimental system set up with commercially available equipment and software to carry out characterization of piezoelectric single crystals with variation in temperature, pressure, and electrical bias fields found in typical practical use. We illustrate its use with data from bulk thickness-mode PMN-29%PT samples, demonstrating variation among nominally identical samples and showing not only the commonly reported changes in permittivity with temperature for bulk material but also significant and complicated changes with pressure and bias field and additional ultrasonic modes which are attributed to material phase changes. The insight this provides may allow the transducer engineer to accelerate new material adoption in devices.
机译:压电单晶材料,例如(x)Pb(Mg1 / 3Nb2 / 3)O3-(1-x)PbTiO3(PMN-PT),在某些方面,其性能明显优于超声应用中已建立的压电陶瓷。但是,它们还会经历相变,从而影响它们在水下声纳和执行器应用以及在高温下的无损检测中遇到的温度和压力下的行为。具有减少这些问题的改性组成的材料目前正在开发中,但是面向应用的表征技术需要进一步关注。关于温度变化的特性描述已被广泛报道,但是所测量的参数范围通常受到限制,压力变化的影响几乎没有引起注意。此外,现在很少报道样品之间的性质变化。本文的重点是一个实验系统,该系统使用可商购的设备和软件进行设置,以对典型实践中发现的温度,压力和电偏置场变化的压电单晶进行表征。我们用散装厚度模式PMN-29%PT样品的数据说明了它的使用,证明了名义上相同的样品之间的差异,不仅显示了通常报道的散装材料的介电常数随温度的变化,而且还显示了随压力和偏置场的显着而复杂的变化。以及归因于材料相变的其他超声模式。这提供的见解可以使换能器工程师加快设备中新材料的采用。

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