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Implementation of modeling and simulation in semiconductor wafer fabrication with time constraints between wet etch and furnace operations

机译:在湿法蚀刻和熔炉操作之间存在时间限制的半导体晶片制造中,建模和仿真的实现

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摘要

In semiconductor wafer fabrication, time constraints between process steps in furnace and wet etch make it difficult to achieve cycle time targets and maximize machine utilization. For capacity planning, it is difficult to estimate the impact of these time constraints on the machine capacity. Infineon Technologies Dresden has conducted a study using discrete event simulation, to investigate the actual situation in the factory and to identify recommendations to eliminate or to reduce the impart of time constraints. The work in this paper yields a two-day reduction in total cycle time after implementation of findings in the factory.
机译:在半导体晶片制造中,熔炉和湿法蚀刻之间的时间限制使得难以实现循环时间目标并最大程度地提高机器利用率。对于容量规划,很难估计这些时间限制对机器容量的影响。 Infineon Technologies德累斯顿已经使用离散事件模拟进行了研究,以调查工厂的实际情况并确定消除或减少时间限制的建议。在工厂执行发现后,本文的工作可将总周期时间减少两天。

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