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State Detection of Bond Wires in IGBT Modules Using Eddy Current Pulsed Thermography

机译:涡流脉冲热成像技术检测IGBT模块中键合线的状态

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Insulated gate bipolar transistor (IGBT) modules are important safety critical components in electrical power systems. Bond wire lift-off, a plastic deformation between wire bond and adjacent layers of a device caused by repeated power/thermal cycles, is the most common failure mechanism in IGBT modules. For the early detection and characterization of such failures, it is important to constantly detect or monitor the health state of IGBT modules, and the state of bond wires in particular. This paper introduces eddy current pulsed thermography (ECPT), a nondestructive evaluation technique, for the state detection and characterization of bond wire lift-off in IGBT modules. After the introduction of the experimental ECPT system, numerical simulation work is reported. The presented simulations are based on the 3-D electromagnetic-thermal coupling finite-element method and analyze transient temperature distribution within the bond wires. This paper illustrates the thermal patterns of bond wires using inductive heating with different wire statuses (lifted-off or well bonded) under two excitation conditions: nonuniform and uniform magnetic field excitations. Experimental results show that uniform excitation of healthy bonding wires, using a Helmholtz coil, provides the same eddy currents on each, while different eddy currents are seen on faulty wires. Both experimental and numerical results show that ECPT can be used for the detection and characterization of bond wires in power semiconductors through the analysis of the transient heating patterns of the wires. The main impact of this paper is that it is the first time electromagnetic induction thermography, so-called ECPT, has been employed on power/electronic devices. Because of its capability of contactless inspection of multiple wires in a single pass, and as such it opens a wide field of investigation in power/electronic devices for failure detection, performance characterization, and health monitoring.
机译:绝缘栅双极晶体管(IGBT)模块是电力系统中重要的安全关键组件。 IGBT组件中最常见的故障机制是键合线剥离,这是由重复的功率/热循环导致的键合线与器件相邻层之间的塑性变形。对于此类故障的早期检测和表征,重要的是不断检测或监视IGBT模块的健康状态,尤其是键合线的状态。本文介绍了一种无损评估技术涡流脉冲热成像(ECPT),用于IGBT模块中键合线剥离的状态检测和表征。在引入实验性ECPT系统后,将进行数值模拟工作。提出的仿真基于3-D电磁热耦合有限元方法,并分析了键合线内的瞬态温度分布。本文说明了在两种激励条件下(非均匀磁场激励和均匀磁场激励)在不同导线状态(剥离或良好粘结)下采用感应加热的键合导线的热模式。实验结果表明,使用亥姆霍兹线圈均匀激励健康的焊线会在每条焊线上产生相同的涡流,而在有故障的焊线上会看到不同的涡流。实验和数值结果均表明,通过分析导线的瞬态加热模式,可以将ECPT用于功率半导体中键合线的检测和表征。本文的主要影响是这是电力/电子设备上首次采用电磁感应热成像技术,即所谓的ECPT。由于它具有通过单次非接触式检查多根电线的能力,因此,它为功率/电子设备的故障检测,性能表征和健康监测打开了广阔的研究领域。

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