机译:考虑功率循环和热循环的IGBT功率模块多目标设计优化
School of Electrical and Electronic Engineering, Newcastle University, Newcastle upon Tyne, U.K.;
Fatigue; Insulated gate bipolar transistors; Multichip modules; Optimization; Resistance; Strain; Stress; Aging; Aging, fatigue; fatigue; finite element methods; finite-element (FE) methods; insulated gate bipolar transistors; insulated-gate bipolar transistors (IGBTs); multi-objective; multiobjective; optimization methods; power cycling; power cycling (PC); reliability; thermal cycling; thermal cycling (TC);
机译:先进的功率循环器在不同结温摆幅下对传递模塑IGBT模块的功率循环测试
机译:使用IGBT模拟器估计IGBT模块的功率损耗,温度和功率周期寿命
机译:用于IGBT模块瞬态热阻抗测量和功率循环的热特性系统
机译:大功率IGBT模块在热循环和功率循环期间的应力分布和失效模式的比较
机译:加速热循环和功率循环下带鸥翼引线的四方扁平封装的焊点设计优化
机译:塞罗普列托地热发电厂单闪和双闪循环的净功率输出和热效率数据
机译:考虑功率循环和热循环的IGBT功率模块多目标设计优化