An ADC test system based on the Macintosh computer

摘要

An ADC test system based on UA1 Macintosh development system is described. The test system includes a CAMAC, 12 bit, 1 /spl mu/s ADC module, an I/O Register, an HP pulse generator, a NIM dual timer and a GPIB programmable Keithley 237 high precision voltage source. The first test program was written in Fortran which gave the test results and histograms on the screen. A new Lab-VIEW 2 test program is also described. An upgrade of the test system and the CAMAC control to VME ADC is now in progress.