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A preamplifier-shaper-stretcher integrated circuit system for use with germanium strip detectors

机译:与锗带检测器一起使用的前置放大器-整形拉伸器集成电路系统

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摘要

A 16-channel integrated circuit readout electronics chip is being developed for use with a germanium strip detector. Such a system will provide superior energy resolution with 2-dimensional imaging in a single instrument that can be used for X-ray imaging and nuclear line gamma-ray spectroscopy. As part of the total ASIC development, prototype ICs of a typical channel have been designed, fabricated and tested. These integrated circuits include a low-noise, variable gain, preamplifier circuit that can detect both positive and negative going input charges, a 4-pole pulse shaper with variable peaking times and a stretcher circuit that can do a peak detect and hold for the different peaking times. The integrated circuits are fabricated in a 1.2 micron n-well CMOS process. The noise performance for this system was measured to be 185erms +14e/pF for a 2 /spl mu/s peaking time and gain at /spl sim/200 mV/fC. Linearity measurements in both inverting and non-inverting modes of operation were approximately +/-1%. Peaking times from 0.5 microseconds to 8 microseconds and gain adjustments to get up to 400 mV/fC per channel were done through digital switching.
机译:正在开发一种用于锗带检测器的16通道集成电路读出电子芯片。这样的系统将在单个仪器中通过二维成像提供卓越的能量分辨率,该仪器可用于X射线成像和核线伽马射线光谱分析。作为整个ASIC开发的一部分,已经设计,制造和测试了典型通道的原型IC。这些集成电路包括可检测正负输入电荷的低噪声,可变增益,前置放大器电路,具有可变峰值时间的四极脉冲整形器以及可对不同信号进行峰值检测和保持的展宽电路高峰时间。集成电路以1.2微米n阱CMOS工艺制造。在2个/ spl mu / s的峰值时间内,该系统的噪声性能测得为185erms + 14e / pF,在/ spl sim / 200 mV / fC时获得了增益。在反相和同相工作模式下的线性度测量值约为+/- 1%。峰值时间从0.5微秒到8微秒,并通过数字开关完成了增益调整,以使每个通道的峰值电流达到400 mV / fC。

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