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Tests Of The Radiation Hardness Of Vlsi Integrated Circuits And Silicon Strip Detectors For The SSC Under Neutron, Proton, And Gamma Irradiation

机译：中子，质子和伽马射线辐照下的SSC用Vlsi集成电路和硅条探测器的辐射硬度测试

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来源
《》|1990年|P.846-853|共8页
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Ziock; H.J.; Milner; C.;
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中图分类无线电电子学、电信技术;
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1. Tests of the radiation hardness of VLSI integrated circuits and silicon strip detectors for the SSC under neutron, proton, and gamma irradiation [J] . Ziock H.J., Milner C. IEEE Transactions on Nuclear Science . 1991,第2期

机译：在中子，质子和γ辐射下测试超大规模集成电路的VLSI集成电路和硅条检测器的辐射硬度
2. The effect of oxygen impurities on radiation hardness of FZ silicon detectors for HEP after neutron, proton and gamma irradiation [J] . Dezillie B., Li Z. IEEE Transactions on Nuclear Science . 2000,第6期

机译：氧杂质对中子，质子和伽马射线辐照后的HEP FZ硅探测器辐射硬度的影响
3. METHOD FOR INTEGRATED CIRCUITS TOTAL IONIZING DOSE HARDNESS TESTING BASED ON COMBINED GAMMA- AND X-RAY IRRADIATION FACILITIES [J] . Armen V. Sogoyan, Alexey S. Artamonov, Aleksander Y Nikiforov, Facta Universitatis. Series Electronics and Energetics . 2014,第3期

机译：基于伽玛射线和X射线辐射相结合的总电离剂量硬度测试的集成方法
4. Tests Of The Radiation Hardness Of Vlsi Integrated Circuits And Silicon Strip Detectors For The SSC Under Neutron, Proton, And Gamma Irradiation [C] . Ziock H.J., Milner C., Institute of Electric and Electronic Engineer IEEE Nuclear Science Symposium . 1990

机译：用于中子，质子和伽马辐射下SSC的VLSI集成电路和硅条探测器的辐射硬度的测试
5. Hardness assurance testing and radiation hardening by design techniques for silicon-germanium heterojunction bipolar transistors and digital logic circuits. [D] . Sutton, Akil K. 2009

机译：通过设计技术对硅锗异质结双极晶体管和数字逻辑电路进行硬度保证测试和辐射硬化。
6. Predicted risks of second malignant neoplasm incidence and mortality due to secondary neutrons in a girl and boy receiving proton craniospinal irradiation [O] . Phillip J Taddei, Anita Mahajan, Dragan Mirkovic, -1

机译：第二恶性肿瘤发病率和死亡率的原因是一个女孩和男孩接收质子颅照射次级中子预测风险
7. Tests of the radiation hardness of VLSI integrated circuits and silicon strip detectors for the SSC under neutron, proton, and gamma irradiation [O] . H.J. Ziock, C. Milner, W.F. Sommer, 1991

机译：用于中子，质子和伽马辐射下SSC的VLSI集成电路和硅条探测器的辐射硬度的测试
8. Tests of the radiation hardness of VLSI Integrated Circuits and Silicon Strip Detectors for the SSC under neutron, proton, and gamma irradiation [R] . Ziock, H. J., Milner, C., Sommer, W. F., 1990

机译：中子，质子和γ辐照下sssI的VLsI集成电路和硅带探测器的辐射硬度测试

Tests Of The Radiation Hardness Of Vlsi Integrated Circuits And Silicon Strip Detectors For The SSC Under Neutron, Proton, And Gamma Irradiation

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