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首页> 外文期刊>IEEE Transactions on Nuclear Science >Powder X-ray diffraction diagram with a silicon microstrip detector
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Powder X-ray diffraction diagram with a silicon microstrip detector

机译:硅微带探测器的粉末X射线衍射图

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The present paper reports on a complete diffraction pattern obtained with a 32 channel Si microstrip detector when a standard ZnO sample is illuminated with 8.04 keV photons. Information from single photon conversion in each detector channel is routed to a VLSI readout chain that contains analog amplification, pulse shaping, digitization and counting circuitry for each individual channel. The read out pitch is 200 /spl mu/m and data acquisition is performed with a custom made PC card. The current system represents an intermediate step toward a long linear array for powder X-ray crystallography.
机译:本文报道了当使用8.04 keV光子照射标准ZnO样品时,使用32通道Si微带检测器获得的完整衍射图样。每个检测器通道中来自单光子转换的信息被路由到VLSI读出链,该链包含每个单个通道的模拟放大,脉冲整形,数字化和计数电路。读出的节距为200 / spl mu / m,并使用定制的PC卡执行数据采集。当前的系统代表了迈向粉末X射线晶体学的长线性阵列的中间步骤。

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