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首页> 外文期刊>IEEE Transactions on Nuclear Science >DRAGO chip: a low-noise CMOS preamplifier shaper for silicon detectors with integrated front-end JFET
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DRAGO chip: a low-noise CMOS preamplifier shaper for silicon detectors with integrated front-end JFET

机译:DRAGO芯片:用于具有集成前端JFET的硅探测器的低噪声CMOS前置放大器整形器

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We present a CMOS preamplifier-shaper circuit designed to be used with low-noise solid-state detectors, like silicon drift detectors (SDDs), in X-ray Spectroscopy and /spl gamma/-ray imaging applications. The circuit is composed of a low-noise preamplifier and by a sixth-order semi-Gaussian shaping amplifier with four selectable peaking times from 1.7 /spl mu/s up to 6 /spl mu/s. The integrated time constants used for the shaping are implemented by means of a recently proposed "RC" cell. This cell is based on the demagnification of the current flowing in a resistor R thanks to the use of current mirrors. The particular solution adopted here allows a precise and stable implementation of the desired time constant, for given values of R and C , and guarantees low-noise performances of the shaping amplifier when used with a cooled SDDs or other solid-state detectors with low leakage current. In this work, the main features of the circuit are first presented. The experimental results obtained with a prototype realized in the 0.35-/spl mu/m 3.3-V CMOS austriamicrosystems technology are then reported and discussed. The energy resolution measured using the chip with a SDD cooled at -10/spl deg/C is 150 eV at 6 keV which corresponds to an electronics noise of 10.8 e-rms.
机译:我们介绍了一种CMOS前置放大器整形电路,该电路设计用于X射线光谱和/ splγ/射线成像应用中的低噪声固态检测器,例如硅漂移检测器(SDD)。该电路由一个低噪声前置放大器和一个六阶半高斯整形放大器组成,该放大器具有四个可选的峰值时间,从1.7 / spl mu / s到6 / spl mu / s。通过最近提出的“ RC”单元来实现用于整形的积分时间常数。由于使用了电流镜,该单元基于流经电阻器R的电流的缩小率。对于给定的R和C值,此处采用的特定解决方案可以精确,稳定地实现所需的时间常数,并与冷却的SDD或其他漏电少的固态检测器一起使用时,可以保证整形放大器的低噪声性能。当前。在这项工作中,首先介绍了电路的主要特征。然后报告并讨论了使用0.35- / spl mu / m 3.3-V CMOS奥地利微系统技术实现的原型获得的实验结果。使用SDD冷却至-10 / spl deg / C的芯片测得的能量分辨率为6 keV时为150 eV,这对应于10.8 e-rms的电子噪声。

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