首页> 外文期刊>Nuclear Science, IEEE Transactions on >Investigations of Optical and Scintillation Properties of $({rm Lu}_{0.1}{rm Y}_{0.9}){rm AlO}_{3}!:!{rm Nd}0.1$%
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Investigations of Optical and Scintillation Properties of $({rm Lu}_{0.1}{rm Y}_{0.9}){rm AlO}_{3}!:!{rm Nd}0.1$%

机译:$({rm Lu} _ {0.1} {rm Y} _ {0.9}){rm AlO} _ {3}!:!! {rm Nd} 0.1 $%的光学和闪烁特性研究

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摘要

$({rm Lu}_{0.1}{rm Y}_{0.9}){rm AlO}_{3}!!:!!{rm Nd}0.1%$ crystal was grown by the ${rm mu}$ -PD method and pure YAP single crystal was prepared as a reference sample. Then, two annealing procedures were performed for each sample at $1350^{circ}{rm C}$ and $1500^{circ}{rm C}$ for 20 hours in oxygen atmosphere to improve the crystallinity and scintillation properties. The XRD results for all the samples were consistent with JCPDS data (#33-0041) and possessed a space group of orthorhombic Pbnm while no impurity peaks were observed. The FWHM values of X-ray rocking curve measurements of the as-grown crystals and the crystals annealed at $1500^{circ}{rm C}$ were 70 and 200 arcsec, respectively. It can be due to the onset of decomposition. In the transmittance measurements, intense absorption peaks were observed approximately at 240 and 290 nm and they were consistent with the bands for color centers: the two-electron F center and one-electron ${rm F}^{+}$ center, respectively. These absorptions were enhanced by Lu substitution. The radio-luminescence spectra show several emission peaks due to ${rm Nd}^{3+}$ 4f-4f transitions and the most intense of which were assigned to $^{2} {rm F}(2)_{5/2}-^{4} {rm F}_{5/2}$, $^{2} {rm F}{(2)}_{5/2}-^{4}{rm G}_{7/2}$ and $^{2} {rm F}{(2)}_{5/2} -^{4}{rm G}_{9/2}$ transitions at 395, 540 and 550 nm, respectively. The light yield after annealing annealing was as high as $5025 pm 500~({rm N}_{rm phe}/{rm MeV})$ when using Si-APD (S8664). The scintillation decay time constants were evaluated to be 3.44–3.80 $mu{rm s}$ for each sample. Afterglow upon X-ray excitation of the as-grown and annealed samples coupled with PIN Si-photodiode was found to be approximately 1200 and 1000 ppm after 100 ms.
机译:$({rm Lu} _ {0.1} {rm Y} _ {0.9}){rm AlO} _ {3} !!:!! {rm Nd} 0.1%$的晶体由$ {rm mu} $生长-PD法和纯YAP单晶被制备为参考样品。然后,对每个样品在氧气氛中以$ 1350 ^(rm C} $和$ 1500 ^ {circ} {rm C} $进行两个退火程序,在氧气气氛中进行20小时,以提高结晶度和闪烁性能。所有样品的XRD结果与JCPDS数据(#33-0041)一致,并具有正交晶Pbnm的空间群,而未观察到杂质峰。刚生长的晶体和在1500℃退火的晶体的X射线摇摆曲线测量的FWHM值分别为70和200 arcsec。这可能是由于分解的开始。在透射率测量中,在大约240和290 nm处观察到强烈的吸收峰,它们与色中心的谱带一致:分别为二电子F中心和单电子$ {rm F} ^ {+} $中心。 。通过Lu取代增强了这些吸收。放射性发光光谱显示出由于$ {rm Nd} ^ {3 +} $ 4f-4f跃迁而产生的几个发射峰,其中最强的峰分配给$ ^ {2} {rm F}(2)_ {5 / 2}-^ {4} {rm F} _ {5/2} $,$ ^ {2} {rm F} {(2)} _ {5/2}-^ {4} {rm G} _ {7/2} $和$ ^ {2} {rm F} {(2)} _ {5/2}-^ {4} {rm G} _ {9/2} $在395、540和550处的过渡纳米。使用Si-APD时,退火退火后的光产率高达$ 5025 pm 500〜({rm N} _ {rm phe} / {rm MeV})$(S8664)。每个样品的闪烁衰减时间常数估计为3.44–3.80μS。 X射线激发的初生退火样品与PIN Si光电二极管耦合后的余辉在100毫秒后约为1200和1000 ppm。

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