The method of lines for the analysis of planar waveguides with finite metallization thickness

摘要

The method of lines is extended to calculate waveguide structures with finite metallization thickness. The normally used range of metallization thickness is not a limit for the method. Particularly when calculating small or moderate thicknesses, it is possible to derive the dispersion constant with only one computed result. When using the optimal edge parameter, P/sub opt/, for that computation, the deviation from the exact dispersion constant is less than 0.5%. The advantage of the method of lines is that only small line numbers are necessary. Hence, the computing time is very small.