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Stability analysis and numerical simulation of multidevice amplifiers

机译:多器件放大器的稳定性分析和数值模拟

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Stability analysis of multidevice amplifiers is made on a generalized circuit comprising two n-ports with S-matrices S (active devices) and S' (passive networks) connected at n interface ports. Open-loop transfer functions defined for a signal-flow graph and its (n-1) subgraphs of incident and reflected waves at the interface ports are expressed in terms of det M/sub n/ and its minors, where M/sub n/=S'S-I/sub n/ and I/sub n/ is the n*n identity matrix. it is shown that the Nyquist plots of the n transfer functions completely characterize the number of right-half complex-frequency-plane zeros of det M/sub n/, and hence the amplifier stability. Insertion of an ideal circulator and isolators at the interface ports enables one to calculate the Nyquist plots and voltage distributions of possible instabilities using commercially available linear circuit simulators. Numerical simulations for two types of parallel-operated GaAs FET amplifiers are performed to verify the usefulness of the analysis in design-phase check of multidevice amplifier stability.
机译:多设备放大器的稳定性分析是在一个通用电路上进行的,该电路包括两个n端口,S矩阵S(有源设备)和S'(无源网络)连接在n个接口端口上。为信号流图及其在接口端口处的入射波和反射波的(n-1)个子图定义的开环传递函数用det M / sub n /及其次要表示,其中M / sub n / = S'S-I / sub n /和I / sub n /是n * n单位矩阵。结果表明,n个传递函数的奈奎斯特图完全表征了det M / sub n /的右半复数频率平面零点的数量,并因此表征了放大器的稳定性。在接口端口上插入理想的循环器和隔离器可以使人们能够使用市售的线性电路仿真器来计算可能的不稳定性的奈奎斯特图和电压分布。进行了两种并联GaAs FET放大器的数值仿真,以验证分析在多器件放大器稳定性设计阶段检查中的有用性。

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