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A generalized scattering matrix approach for analysis of quasi-optical grids and de-embedding of device parameters

机译:广义散射矩阵方法用于准光学网格分析和设备参数去嵌入

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摘要

A generalized scattering matrix approach to analyzing quasi-optical grids used for grid amplifiers and grid oscillators is developed. The approach is verified by a novel method for de-embedding, in a waveguide simulator, the active device parameters of a differential pair high electron mobility transistor (HEMT) from the single unit cell of a grid amplifier. The method incorporates the additional ports presented to the active device into a method of moments solution of the embedding periodic array. The port(s) defined at the device or load location are within the plane of the array, and not terminated in a microstrip line with a known characteristic impedance. Therefore the generalized scattering matrix for the embedding array is normalized to the calculated input impedance(s) at these port(s). The approach described here uses a Floquet representation of the fields incident and reflected from the grid as the remaining ports in the generalized scattering matrix. The use of Floquet modes allows analysis of general geometries and nonnormal incident angles without the need for magnetic and electric wall assumptions. By developing a generalized scattering matrix for the embedding periodic array, this approach now allows conventional amplifier design techniques and analysis methods to be applied to quasi-optical grid amplifier and oscillator design. The major advantage of this unification for grid amplifier design being that the stability of the design can be predicted.
机译:开发了一种广义散射矩阵方法来分析用于栅格放大器和栅格振荡器的准光学栅格。该方法已通过一种新颖的方法进行了验证,该方法用于在波导模拟器中反嵌来自网格放大器单个单元的差分对高电子迁移率晶体管(HEMT)的有源器件参数。该方法将呈现给有源设备的附加端口合并到嵌入周期阵列的矩量求解方法中。在设备或负载位置定义的端口在阵列平面内,并且未端接具有已知特征阻抗的微带线。因此,将嵌入阵列的广义散射矩阵归一化为这些端口处计算出的输入阻抗。此处描述的方法将入射并从网格反射的场的Floquet表示用作广义散射矩阵中的其余端口。使用Floquet模式可以分析一般的几何形状和非法向入射角,而无需考虑磁壁和电壁。通过为嵌入式周期阵列开发通用的散射矩阵,该方法现在允许将常规放大器设计技术和分析方法应用于准光学栅格放大器和振荡器设计。网格放大器设计的这种统一的主要优点是可以预测设计的稳定性。

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