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首页> 外文期刊>IEEE Transactions on Microwave Theory and Techniques >Modeling the bias and temperature dependence of a C-class MESFET amplifier
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Modeling the bias and temperature dependence of a C-class MESFET amplifier

机译:模拟C级MESFET放大器的偏置和温度依赖性

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In this paper, a complete bias and temperature-dependent large-signal model for a MESFET is determined from experimental S-parameters and dc measurements. This model is used in the analysis of the performance of a C-class amplifier at 4 GHz over a -50/spl deg/ to 100/spl deg/C temperature range and for different bias conditions. The dependencies of the elements of the equivalent circuit, as well as the amplifier gain on the temperature and the operating point, are evaluated. The gain optimization and the analysis as a function of temperature of the MESFET amplifier are done by using the describing function technique. Optimum bias device conditions in the C-class are obtained for maximum gain and also the flattest gain versus input power rate. A comparison between theoretical and measured results over temperature and bias ranges is shown. Experimental results show an excellent agreement with the theoretical analysis.
机译:在本文中,通过实验的S参数和直流测量确定了MESFET的完整的偏置和与温度相关的大信号模型。该模型用于分析C级放大器在-50 / spl deg //至100 / spl deg / C的温度范围内以及不同偏置条件下在4 GHz下的性能。评估等效电路元件的依赖性以及放大器增益对温度和工作点的影响。通过使用描述函数技术完成了增益优化和作为MESFET放大器温度的函数的分析。获得C级的最佳偏置器件条件以获得最大增益,以及最平坦的增益与输入功率比。显示了在温度和偏置范围内的理论和测量结果之间的比较。实验结果与理论分析吻合良好。

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