Dielectric Constant, Loss Tangent, and Surface Resistance of PCB Materials at K-Band Frequencies

摘要

This paper develops the theoretical approach and describes the design of a practical test rig for measuring the microwave parameters of unclad and laminated dielectric substrates. The test rig is based on a sapphire whispering-gallery resonator and allows the measurement of the following parameters: dielectric constant (ε) of the dielectric substrate in the range from 2 to 10, loss tangent (tan δ) of the dielectric substrate in the range from 10~(-4) to 10~(-2), and microwave losses of copper coating of the substrate in the range from 0.03 to 0.3 Ω. Measurements of numerous commonly used microwave printed-circuit-board materials were performed at frequencies between 30-40 GHz and over a temperature range of -50℃ to +70℃.