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On the Accuracy of the Parameters Extracted From $S$-Parameter Measurements Taken on Differential IC Transmission Lines

机译:从$ S $参数测量值提取的差分IC传输线上的参数精度

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摘要

In this paper, we compare the accuracy of the telegrapher's equation transmission line parameters extracted with different methods from deembedded S-parameter measurements taken on differential integrated circuit transmission lines. We present a mathematical proof that conventional ldquoopen-shortrdquo deembedding is sufficient to extract the intrinsic propagation constant gamma of the transmission line, but that at the same time, some deembedding errors will remain for the extracted characteristic impedance Z 0. We illustrate this by comparing experimental results obtained after ldquoopen-shortrdquo and ldquoshort-openrdquo deembedding, and explain that as a result of this, using either known capacitance/known conductance or known inductance/known resistance approximations to study the remaining transmission line parameters can be attractive.
机译:在本文中,我们比较了从差分集成电路传输线上进行的嵌入式S参数测量中,采用不同方法提取的电报方程传输线参数的准确性。我们提供了一个数学证明,即传统的“短时开放-短时”去嵌入足以提取传输线的固有传播常数γ,但同时,对于所提取的特征阻抗Z 0仍会存在一些去嵌入误差。在ldopen-shortrd和ldquoshort-openrdem解嵌之后获得的实验结果,并解释了其结果,使用已知的电容/已知的电导率或已知的电感/已知的电阻近似值来研究剩余的传输线参数可能很有吸引力。

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