机译:从$ S $参数测量值提取的差分IC传输线上的参数精度
Res. Centre, NXP Semicond.-Taiwan Semicond. Manuf. Co., Eindhoven;
high-frequency transmission lines; integrated circuit interconnections; S-parameter measurements; capacitance-known capacitance; deembedded -parameter measurements; deembedding errors; differential IC transmission lines; extracted characteristic impedance Z0; intrinsic propagation constant gamma; known inductance-known resistance approximations; open-short deembedding; short-open deembedding; Deembedding; integrated circuits; on-chip interconnect transmission lines; on-wafer microwave measurements;
机译:从两端口测量重建差分传输线的四端口S参数时减少故障
机译:S参数测量可得出多导体传输线的特征矩阵
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