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Sensitivity of Microwave Imaging Systems Employing Scattering-Parameter Measurements

机译:使用散射参数测量的微波成像系统的灵敏度

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摘要

The physical contrast sensitivity of microwave imaging systems employing scattering-parameter measurements is defined. Methodologies are proposed for its evaluation through measurements and through simulations. This enables the estimation of the smallest detectable target permittivity contrast or size for the system under evaluation. The outcomes of the proposed simulation-based and measurement-based methods are compared for the case of a realistic tissue-imaging system. The agreement between the simulated and measured sensitivity estimation validates the proposed methods. The intention of the proposed methodology is to provide common means to quantify and compare the sensitivity performance of microwave systems used in tissue imaging as well as the antennas used as sensors. We emphasize that the proposed method targets the performance of the hardware and it is not concerned with the image-reconstruction algorithms.
机译:定义了采用散射参数测量的微波成像系统的物理对比灵敏度。提出了通过测量和模拟进行评估的方法。这使得能够估计被评估系统的最小可检测目标介电常数对比度或大小。对于实际的组织成像系统,比较了所提出的基于仿真和基于测量的方法的结果。仿真和测量的灵敏度估计之间的一致性验证了所提出的方法。所提出的方法的目的是提供量化和比较用于组织成像的微波系统以及用作传感器的天线的灵敏度性能的通用方法。我们强调,该方法针对的是硬件性能,与图像重建算法无关。

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