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New General Formulation and Experimental Verification of Harmonic Clipping Contours in High-Frequency Power Devices

机译:高频功率器件谐波截断轮廓的新通用公式及实验验证

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This paper presents a novel closed-form solution for the theoretical calculation of harmonic clipping contours when an arbitrary number of harmonics is considered. The clipping contours can be used to design the loads of a high-frequency power device in order to avoid drain current clipping, and hence preventing strong nonlinear effects. For the first time the predicted second harmonic contours are validated thoroughly by means of experimental characterization of GaN HEMT devices. The measured contours result in good agreement with the theory. Moreover, the effect of third harmonic load tuning is also assessed and verified for the first time. These results prove that the clipping contours can be used as a tool for the systematic design of low-distortion power amplifiers.
机译:当考虑任意数量的谐波时,本文提出了一种新的闭式解,用于谐波削波轮廓的理论计算。削波轮廓可用于设计高频功率设备的负载,以避免漏极电流削波,从而防止强烈的非线性效应。首次通过GaN HEMT器件的实验表征彻底验证了预测的二次谐波轮廓。测得的轮廓与理论吻合良好。此外,还首次评估和验证了三次谐波负载调整的效果。这些结果证明,削波轮廓可以用作低失真功率放大器系统设计的工具。

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