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首页> 外文期刊>IEEE Transactions on Magnetics >A Trailing Shield Perpendicular Writer Design With Tapered Write Gap for High Density Recording
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A Trailing Shield Perpendicular Writer Design With Tapered Write Gap for High Density Recording

机译:用于高密度记录的具有锥形写入间隙的尾随式屏蔽垂直写入器设计

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摘要

With the continuous push for high areal density, the conventional trailing shield perpendicular writer design faces an increasing challenge in maintaining sufficient writability while scaling down the dimensions of the write pole and the shield. In this work, we investigate an improved trailing shield design with the tapered write gap (TWG). It has been found that the TWG design has two unique recording characteristics that enable better extendibility: 1) flux concentration and 2) self-compensation. Both modeling and experimental results show that the TWG design has superior dynamic performance (DP) than conventional trailing shield design, while the sigma of DP parameters induced by the wafer/back-end variations is reduced.
机译:随着对高面密度的不断推动,传统的尾随屏蔽垂直写入器设计在保持足够的可写性同时缩小写入极和屏蔽的尺寸时面临着越来越大的挑战。在这项工作中,我们研究了具有锥形写入间隙(TWG)的改进的尾随屏蔽设计。已经发现,TWG设计具有两个独特的记录特性,可实现更好的扩展性:1)助焊剂浓度和2)自补偿。建模和实验结果均表明,TWG设计比传统的尾随屏蔽设计具有更好的动态性能(DP),同时减小了晶圆/后端变化引起的DP参数的总和。

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