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Experimental Investigation of DC-Bias Related Core Losses in a Boost Inductor

机译:升压电感器中与直流偏置相关的磁芯损耗的实验研究

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Soft magnetic components in electronic systems are often subjected to dc bias-flux conditions. These dc bias conditions result in distorted hysteresis loops, increased core losses, and have been shown to be independent of core material. The physical origin of these increased losses is not well understood and there is no simple model that can predict these losses without extensive measurements. Absence of a widely accepted model coupled with the complete lack of dc loss attributes on core manufacturers' data sheets result in a requirement to empirically determine loss values for specific design applications. These deficiencies have motivated our efforts to investigate dc bias dependent loss phenomenon in a Fe-based Metglas core inductor operating in a dc-dc boost converter. Since dc flux levels in the core are proportional to the controllable converter load currents, this topology is ideal to study dc-related losses. Inductor core $B-H$ hysteresis loop characterization was accomplished as a function of switching frequency, input voltage, and load current operating conditions and parameters. In this paper, the core loss results were presented as a function of the dc bias conditions, and the results showed that the core losses increased with the pre-magnetized $(B_{rm dc})$ fields. As a result of our observations, we have proposed a modification to the conventional Steinmetz loss equation to include the effects of dc pre-magnetization flux in the core.
机译:电子系统中的软磁组件通常会受到直流偏置磁通的影响。这些直流偏置条件会导致磁滞回线失真,铁芯损耗增加,并且已证明与铁芯材料无关。这些增加的损失的物理起因还没有被很好地理解,并且没有简单的模型可以预测这些损失而无需进行大量测量。由于缺乏广泛接受的模型,而核心制造商的数据手册上却完全缺乏直流损耗属性,因此需要根据经验确定特定设计应用的损耗值。这些缺陷促使我们努力研究在直流-直流升压转换器中工作的铁基Metglas铁芯电感器中的直流偏置相关损耗现象。由于铁心中的直流磁通量与转换器的可控负载电流成正比,因此该拓扑非常适合研究与直流相关的损耗。磁芯的磁滞回线特性是根据开关频率,输入电压和负载电流工作条件而定的,并且实现了以下特性:电感磁芯 $ BH $ 参数。在本文中,磁芯损耗结果是作为直流偏置条件的函数,结果表明,磁芯损耗随预磁化的<公式式= inline“> $ (B_ {rm dc})$ 字段。根据我们的观察结果,我们提出了对常规Steinmetz损耗方程的修改,以将铁心中的直流预磁通量的影响包括在内。

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