Analysis of tunneling magnetic force microscopy using a flexible triangular probe

摘要

The authors have performed a theoretical analysis of the interaction between a flexible triangular probe and a typical magnetic pattern on a recorded surface. The use of this analysis allows the measurement of the magnetic fields of the recorded patterns imaged by a tunneling magnetic force microscope. It is also shown how the sensitivity of the microscope varies with the orientation of the probe, and how this relates to experimental data.