Microstructural origin of the perpendicular anisotropy in M-type barium hexaferrite thin films deposited by RF magnetron sputtering

摘要

Barium hexaferrite thin films deposited by RF magnetron sputtering have exhibited saturation magnetization 90% of that of bulk single crystals, whereas the perpendicular uniaxial anisotropy is only 60% of that of the bulk. X-ray diffraction spectra suggest good c-axis orientation perpendicular to the film plane. However, M-H hysteresis loops show a fairly large in-plane hysteresis. Scanning electron microscopy and transmission electron microscopy show that the films are made of a mixture of platelet-shaped grains and acicular grains. Microdiffraction studies in a transmission electron microscope indicate that the platelets have their c-axis oriented perpendicular to the plane and that the acicular grains have c-axis orientation in the plane. Preferential grain growth in the basal plane of the crystal is believed to be responsible for these grain geometries.