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A two step detection scheme for high intersymbol interference

机译:高符号间干扰的两步检测方案

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摘要

The algorithm of a new two step detection scheme is described. The performance of the detection scheme has been evaluated by means of read signals from a prototype thin film disk drive with PW50/T greater than three. The detection procedure is divided in a first step which is bit-by-bit and a second step which is sequence oriented. Upper bounds for the error rates of the new detection scheme in the presence of system noise are estimated. The results show an improvement compared to peak detection of about 25% in recording density at an error rate of 10/sup -9/.
机译:描述了一种新的两步检测方案的算法。已经通过来自PW50 / T大于3的原型薄膜磁盘驱动器的读取信号评估了检测方案的性能。该检测过程分为按位的第一步和面向序列的第二步。在存在系统噪声的情况下,估计新检测方案的错误率的上限。结果表明,与峰值检测相比,记录密度提高了约25%,错误率为10 / sup -9 /。

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