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A soft error rate model for predicting off-track performance

机译:用于预测偏离轨道性能的软错误率模型

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摘要

Specifying the head and determining the track density are critical, interdependent decisions made early in the development of a hard disk drive. We have created a soft error rate model to be used as a tool to aid in making these decisions. We have also developed methods to estimate the side reading and writing parameters of a head using well known spinstand tests. In addition to these four reading and writing parameters, the model requires an estimate of the track misregistration (TMR) and a sixth input parameter, the effective on-track signal-to-noise ratio (SNR/sub eff/) of the channel. The utility of the model is demonstrated in a test case based on a system with a thin film head/medium and a peak detection channel. The model is used to predict error rate both as a function of track density for a given head and as a function of head width for a given track density. The validity of the model is demonstrated by the close agreement of simulated 747 curves generated by the model with experimental 747 curves measured as a spinstand.ETX
机译:指定磁头和确定磁道密度是硬盘驱动器开发初期做出的至关重要的,相互依赖的决定。我们创建了一个软错误率模型,以用作辅助做出这些决策的工具。我们还开发了使用众所周知的自旋支架测试来估计磁头侧面读取和写入参数的方法。除了这四个读写参数外,该模型还需要估算磁道未配准(TMR)和第六个输入参数,即通道的有效磁道上信噪比(SNR / sub eff /)。该模型的实用性在基于带有薄膜头/介质和峰检测通道的系统的测试案例中得到了证明。该模型用于根据给定磁头的磁道密度和磁头宽度的函数来预测错误率。该模型的仿真747曲线与作为自旋架的实测747曲线之间的吻合证明了该模型的有效性。 ETX

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