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首页> 外文期刊>IEEE Transactions on Circuits and Systems. I, Regular Papers >A 4-kb Low-Power SRAM Design With Negative Word-Line Scheme
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A 4-kb Low-Power SRAM Design With Negative Word-Line Scheme

机译:具有负字线方案的4kb低功耗SRAM设计

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摘要

The physical implementation of a prototypical 250-MHz CMOS 4-T SRAM is described in this paper. The proposed SRAM cell takes advantage of a negative word-line scheme to minimize the leakage current of the cell access transistors. As a result, the standby power consumption is drastically reduced. The proposed 4-kb 4-T SRAM is measured to consume 0.32 mW in the standby mode, and a 3.8-ns access time in the R/W mode. The highest operating clock rate is measured to be 263 MHz
机译:本文介绍了原型250MHz CMOS 4-T SRAM的物理实现。所提出的SRAM单元利用负字线方案来最小化单元存取晶体管的泄漏电流。结果,大大降低了待机功耗。在待机模式下,建议的4-kb 4-T SRAM的功耗为0.32 mW,在R / W模式下的访问时间为3.8ns。最高工作时钟速率测得为263 MHz

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