Novel Process and Temperature-Stable, IDD Sensor for the BIST Design of Embedded Digital, Analog, and Mixed-Signal Circuits

摘要

This paper proposes a new IDD sensor for built-in self-test (BIST) applications for digital, analog, and mixed-signal circuits. This novel, wide-band, nonintrusive, process and temperature-stable IDD sensor operates up to 230 MHz, which is 2.3X faster than previously proposed designs, and occupies 78.3% less area than another competing design. A BIST utilizing this novel IDD sensor is created and tested on numerous digital circuits, as well as on an op-amp and a mixer, achieving up to 90% fault coverage, while maintaining the performance of the circuit-under-test. The experiments were implemented in 0.18-m TSMC CMOS mixed-signal technology.