Modal characterization using Bragg gratings in photosensitive SiO/sub 2/-Si strip waveguides

摘要

New methods for modal characterization of silica waveguides using UV-induced Bragg gratings are proposed. These methods rely either on the filtering of the fundamental optical mode with a Bragg filter or on the mode coupling by tilting the Bragg grating relative to the optical axis. Both theoretical and experimental results are reported.