This paper introduces a novel method that allows fast and reliable extraction of material parameters in terahertz time-domain spectroscopy. This method could be applied for most materials and requires neither simplifying assumptions nor samples of different thickness for the extraction. The presented extraction procedure operates either on truncated terahertz signals when temporal windowing is possible, or on full ones otherwise. Some experimental examples covering all practical cases are given. In particular, the extraction procedure treats the tedious case of samples for which internal reflections of the terahertz pulse slightly overlap.
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