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GaAs-based modulation-doped quantum-well infrared photodetectors for single- and two-color detection in 3-5 Μm

机译:基于GaAs的调制掺杂量子阱红外光电探测器,用于3-5微米的单色和双色探测

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Double-barrier quantum-well infrared photodetectors are promising for operation in the midinfrared region. In this paper, we present a series of novel molecular beam epitaxy (MBE)-grown devices based on modulation-doped (MD) AlGaAs-AlAs-GaAs structures that exhibit a remarkable responsivity at zero bias (0.05 A/W) at 4.6 Μm. Since the photovoltaic properties are strongly dependent on the symmetry of the potential profile, we have systematically varied the position of the dopant in the barriers for a series of single-color detectors. Low-temperature photocurrent spectra and current-voltage (I-V) characteristics (in the dark and under illumination) show that the location of the dopant is a relevant design parameter, due to its role in the photovoltaic behavior (i.e., the presence or absence of zero bias signal). The performance of the MD devices is compared with that of a detector with doping in the center of the well and otherwise the same structure. In particular, the responsivity and detectivity seem to be higher for the MD detectors than for well-doped samples, especially when the dopant is located in the barrier closest to the substrate. Therefore, we have chosen that MD dopant profile when designing and growing, to our knowledge, the first 3-5 Μm two-color detector, with simultaneous detection at 3.8 and 4.4 Μm.
机译:双屏障量子阱红外光电探测器有望在中红外地区运行。在本文中,我们介绍了一系列基于调制掺杂(MD)AlGaAs-AlAs-GaAs结构的新型分子束外延(MBE)生长的器件,这些器件在4.6μm的零偏压(0.05 A / W)下表现出显着的响应性。由于光伏特性强烈依赖于电位分布的对称性,因此我们针对一系列单色检测器系统地改变了势垒中掺杂剂的位置。低温光电流谱和电流-电压(IV)特性(在黑暗和光照下)表明,掺杂剂的位置是相关的设计参数,这归因于掺杂剂在光伏行为中的作用(即是否存在掺杂剂)。零偏置信号)。将MD器件的性能与掺杂在阱中心且结构相同的检测器的性能进行比较。特别是,MD探测器的响应度和探测性似乎比掺杂良好的样品要高,尤其是当掺杂剂位于最靠近基板的势垒中时。因此,据我们所知,我们在设计和生长第一个3-5微米双色检测器时选择了MD掺杂剂分布,并同时检测了3.8和4.4微米。

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