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Characterization of Semiconductor-Based Optical Frequency Comb Sources Using Generalized Multiheterodyne Detection

机译:利用广义多外差检测技术表征基于半导体的光频梳源

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摘要

A spectrally efficient multiheterodyne scheme is applied for the independent measurement of the spectral phase profiles of three distinct semiconductor frequency combs. The amount of quadratic and cubic phase is quantified for each source, providing insight on the dispersive properties of the semiconductor gain and the fiberized laser cavity. This information is vital for the optimization and expansion of the spectral bandwidth of such sources.
机译:频谱有效的多外差方案适用于三个不同半导体频率梳的频谱相位分布的独立测量。量化了每个光源的二次方和立方相的数量,从而洞悉了半导体增益和光纤激光器腔的色散特性。该信息对于优化和扩展此类光源的频谱带宽至关重要。

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