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Analysis of Single-Photon-Detection Characteristics of GaInAs/InP Avalanche Photodiodes

机译:GaInAs / InP雪崩光电二极管的单光子检测特性分析

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An effective method to analyze the origin of primary dark counts is presented for single-photon-detection avalanche photodiodes (APDs) operated in the gated Geiger modes. It is revealed that a band-to-band tunneling model reproduces the experimental data very well for GaInAs/InP single-photon-detection APDs, while a phonon-assisted tunneling model fails. Therefore, we concluded that primary dark counts are dominated by the band-to-band tunneling for the GaInAs/InP single-photon-detection APDs. Then, we calculate the dark count probability and the detection efficiency by modeling the band-to-band tunneling. It is found that the ratio of the dark count probability to the detection efficiency is reduced by decreasing the impurity concentration of the multiplication region and of the p-type window.
机译:提出了一种有效的方法来分析以门控盖革模式工作的单光子检测雪崩光电二极管(APD)的原始暗计数的起源。结果表明,带间隧穿模型很好地再现了GaInAs / InP单光子检测APD的实验数据,而声子辅助隧穿模型则失败了。因此,我们得出结论,对于GaInAs / InP单光子检测APD,带间隧穿控制了主要的暗计数。然后,我们通过对频带间隧道进行建模来计算暗计数概率和检测效率。发现通过减少乘法区域和p型窗口的杂质浓度,暗计数概率与检测效率的比率减小。

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