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Joint time-frequency measurements of modelocked semiconductor diodelasers and dynamics using frequency-resolved optical gating

机译:使用频率分辨光学门控联合对接的半导体二极管激光器进行时频测量和动力学

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摘要

Joint time-frequency ultrafast measurements usingnfrequency-resolved optical gating (FROG) have been used to provide anfundamental understanding of: (1) ultrashort pulse propagation innsemiconductor optical amplifiers; (2) the modelocking dynamics innexternal cavity semiconductor diode lasers; and (3) correlatednmultiple-wavelength generation from mode locked semiconductor lasers.nThe pulse shaping and chirping effects measured by FROG are shown to benattributed to intracavity gain and saturable absorbing dynamics, as wellnas group velocity dispersion. In addition, the intracavity gain dynamicsnshow a regime of transient unsaturated gain, which can be exploited tonallow phase-correlated multiple-wavelength modelocked operation from ansingle-stripe external-cavity semiconductor diode laser. In this case,nFROG techniques are used to understand the underlying mechanismsninvolved in the phase correlation process
机译:使用频率分辨光学选通(FROG)进行联合时频超快测量可提供以下方面的基本知识:(1)超短脉冲传播半导体光放大器; (2)内腔半导体二极管激光器的模托动力学; (3)锁模半导体激光器产生的多波长相关。n FROG测量的脉冲整形和线性调频效应被证明与腔内增益和饱和吸收动力学有关,以及Wellnas群速度色散。此外,腔内增益动力学n显示出瞬态不饱和增益的状态,可以通过单条纹外腔半导体二极管激光器利用与牛磺酸相位相关的多波长模型化操作。在这种情况下,nFROG技术用于了解相位相关过程中涉及的潜在机制

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