首页> 外文期刊>IEEE Journal of Quantum Electronics >Polarization Dependent Loss and Temperature Fluctuations Effect on Degree of Orthogonality in Polarization Multiplexed Arrayed Waveguide Grating Based Distribution Networks
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Polarization Dependent Loss and Temperature Fluctuations Effect on Degree of Orthogonality in Polarization Multiplexed Arrayed Waveguide Grating Based Distribution Networks

机译:极化相关损耗和温度波动对基于极化多路复用阵列波导光栅的配电网正交度的影响

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摘要

We analyze the effect of arrayed-waveguide grating (AWG) polarization dependent loss (PDL) on the orthogonality between polarization multiplexed channels in a cascaded AWG-based access network topology. For a single AWG, with 0.5-dB PDL, we find an experimental degradation in polarization multiplexing orthogonality to be a maximum of 0.9 deg, in good agreement with theory. In addition, experimental, and numerically simulated maps of orthogonality degradation versus input states of polarization (SOP) are investigated and found to agree well. Consequently, we analyze the effect of cascaded AWGs and again find that the experimental result of maximum 2.9 deg degradation in polarization multiplexing orthogonality closely matches theoretical predictions. Thermal variations are also found to have similar effects for all SOPs, with a measured degradation in orthogonality of up to 2.5 deg for a temperature range between 20 deg C and 55 deg C. Overall, this indicates the robustness of polarization multiplexing, making it applicable for appropriate deployment in bandwidth/user-enhanced access networks based on cascaded AWGs.
机译:我们分析了级联基于AWG的接入网络拓扑中,阵列波导光栅(AWG)偏振相关损耗(PDL)对偏振复用通道之间正交性的影响。对于具有0.5dB PDL的单个AWG,我们发现偏振复用正交性的实验劣化最大为0.9度,与理论相符。此外,对正交性退化与偏振输入状态(SOP)的实验图和数值模拟图进行了研究,发现非常吻合。因此,我们分析了级联AWG的影响,并再次发现偏振多路复用正交性中最大2.9度劣化的实验结果与理论预测非常吻合。还发现热变化对所有SOP都具有相似的影响,在20摄氏度至55摄氏度之间的温度范围内,测得的正交性退化高达2.5度。总体而言,这表明偏振复用的稳健性,使其可适用以便在基于级联AWG的带宽/用户增强型接入网络中进行适当的部署。

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