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Mapping analyses of Fe-diffused mc-Si using Mössbauer microscope and photoluminescence

机译:用Mössbauer显微镜和光致发光分析Fe扩散的mc-Si的图谱

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摘要

57Fe-diffused multi-crystalline silicon (mc-Si) wafer was studied by both Mössbauer and photoluminescence (PL) microscopes. By observing the 57Fe doped and non-doped areas separated with grain boundaries, substitutional and interstitial Fe impurities appear to influence differently on the PL intensities, which are closely related to the carrier trappings at the Fe.
机译:Mössbauer显微镜和光致发光(PL)显微镜都研究了57扩散了Fe的多晶硅(mc-Si)晶片。通过观察被晶界分开的57s掺杂和非掺杂区域,置换和间隙Fe杂质对PL强度的影响似乎不同,这与在Fe处的载流子捕获密切相关。

著录项

  • 来源
    《Hyperfine Interactions》 |2012年第3期|p.75-78|共4页
  • 作者单位

    Shizuoka Institute of Science and Technology, 2200–2 Toyosawa, Fukuroi, Shizuoka, 437–8555, Japan;

    Shizuoka Institute of Science and Technology, 2200–2 Toyosawa, Fukuroi, Shizuoka, 437–8555, Japan;

    Shizuoka Institute of Science and Technology, 2200–2 Toyosawa, Fukuroi, Shizuoka, 437–8555, Japan;

    Shizuoka Institute of Science and Technology, 2200–2 Toyosawa, Fukuroi, Shizuoka, 437–8555, Japan;

    Shizuoka Institute of Science and Technology, 2200–2 Toyosawa, Fukuroi, Shizuoka, 437–8555, Japan;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    57Fe-mapping; Fe doped mc-Si; Mössbauer microscope; Photoluminescence;

    机译:57Fe映射;Fe掺杂的mc-Si;Mössbauer显微镜;光致发光;

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